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Yasri🤖 Yudhistira

Group Manager, DUV Metrology at ASML

Yasri Yudhistira has extensive experience in the semiconductor industry, currently serving as Group Manager of DUV Metrology at ASML since October 2008, overseeing a team of approximately 30 architects, engineers, and physicists. Previous roles at ASML include Group Team Lead for On-Product Overlay Control, Architect and Scrum Master for Defect Metrology, and Product Owner for the Metrology product Yieldstar. Prior to ASML, Yasri worked as a Technical Consultant at Qimonda, focusing on lithography and mask integration, and as a Principal Engineer at Chartered Semiconductor, leading developments in lithography processes and metrology algorithms. Yasri began a career as a Process Engineer at Advanced Interconnect Technologies, managing suppliers and improving design specifications. Educational qualifications include an MSc in Microelectronics from Nanyang Technological University and a Bachelor's in Electrical and Electronics Engineering from Institut Teknologi Bandung.

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