JP Analytical is an R&D Partner and Analytical Service provider. JP Analytical provides materials and thin-film analysis and R&D solutions to surface science projects. The centerpiece of JP Analytical toolset is a 2.5 MV Van de Graaff Accelerator. The suite of accelerator-based Ion bean analysis techniques includes RBS (Rutherford backscattering spectrometry), hydrogen forward scattering, PIXE (particle-induced X-ray emission), NRA (nuclear reaction analysis, particle-induced gamma emission, and ionoluminescence (IL) using a micrometer to mm size beam spots. Additional toolset includes XPS, XRF, AFM, PALS, and XRD. 
JP Analytical can work collaboratively with clients on research projects. 
To discuss materials analysis need or potential collaborations, just call us at (580) 319-8198 ask for Dr. Khalid Hossain. Email us at info@jpanalytical.com 

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