Tom Dean

Tom Dean is a highly experienced engineering professional with extensive expertise in reliability operations, product testing, and engineering education. Currently serving as the Reliability Operations Manager for Analog Devices since August 2011, Tom manages a global team focused on new product reliability qualification and stress testing methods. Previous roles at Analog Devices include Senior Product/Test Engineer and Mixed-Signal Product/Test Manager, where Tom supervised teams and developed innovative testing strategies for advanced communication technologies. In addition to corporate roles, Tom contributes to the academic community as an Adjunct Faculty member at the University of Massachusetts Lowell and serves as a Program Evaluator for ABET. With a solid educational background, including a Master’s degree in Electrical Engineering with a focus on semiconductors, Tom's career spans over three decades, including positions at MediaTek and Polaroid, where Tom developed and implemented automated testing solutions.