Mo Alam

Mo Alam is a seasoned Technical Program Manager with extensive experience in semiconductor and electronics engineering. Currently at Frontier Semiconductor, Mo leads an engineering team in the development of semiconductor wafer inspection and metrology systems, overseeing the process from R&D to volume manufacturing. Previously at Apple, Mo managed a hardware test engineering team focused on high-resolution color detection technologies and calibration methodologies for various Apple devices. Mo's career began at Intel Corporation as a Sr. Product Engineer, where significant contributions were made in developing test environments for semiconductor devices and optimizing performance. Mo holds a Master's degree in Electrical and Electronics Engineering from Texas A&M University and a Bachelor of Science degree in the same field from Bangladesh University of Engineering and Technology.