Roy de Kok

Roy de Kok is a seasoned software engineer with extensive experience in software development and engineering. Currently at Nearfield Instruments B.V. since August 2018, Roy specializes in .NET C# software engineering for the ultrafast High-Throughput Atomic Force Microscopy (HT-AFM) system, focusing on advanced IC metrology. Prior roles include consulting at Capgemini Engineering, and software development at Yucat Mobile Business Solutions. Roy began the professional journey as a graduate at NCIM following a foundational role at Yucat Mobile Business Solutions. Educationally, Roy holds a degree from the HU University of Applied Sciences Utrecht, complemented by secondary education from Alberdingk Thijm College.