Michael Gardner

Michael Gardner has extensive experience in metrology and engineering, currently serving as a Metrology Engineering Tech at NY CREATES since January 2022, specializing in the metrology of films using advanced techniques such as Ellipsometry, XRR, XRD, and XPS, with proficiency in tools like KLA, NOVA, and Bruker. Previously, Michael held a similar role at IBM from March 2019 to January 2022. Additional experience includes serving as an Equipment Support Engineer at Rensselaer Polytechnic Institute and a Research Support Engineer / Lab Manager at SUNY Polytechnic Institute, where responsibilities encompassed thin film processes in renewable energy research. Michael's career began as a Process Engineer at SuperPower Inc., and also includes a tenure as a Manufacturing Engineer at Intermagnetics General Corp. Michael holds a Bachelor of Science degree in Manufacturing Engineering Technology from Brigham Young University.